MIMOS’ Advanced Analytical
Failure Analysis, Material Analysis and Nano Characterization Labs are equipped with a complete spectrum of state-of-art analytical and characterisation instruments
Among our clients
MIMOS’ Advanced Analytical Laboratory
As National applied R&D centre, we have been providing high value-added services for the industry and academia by offering its technological capabilities and advanced analytical facilities such as such as Transmission Electron Microscope (TEM), Dual Beam System, Time of Flight - Secondary Ion Mass Spectrometry (TOF-SIMS), Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS),
Meeting Industrial Needs With Tech Capabilities
MIMOS Analytical Laboratory has played an active role as an enabler to facilitate the growth of local E&E in Malaysia. It is an important ecosystem to support the semiconductor industry that comprises IC design, wafer fabrication, packaging assembly and board assembly on failure analysis and material analysis.
MIMOS Advanced Analytical Laboratory
- Real-time X-Ray (2D) & 3D X-Ray
- Curve Tracer (Logic, High Voltage & High Current)
- Photon Emission Microscope (PEM) with Back-side Capability + Optical Beam Induced Resistance Change (OBIRCH)
- Thermal Emission Microscope with Lock-in Function
- Field Emission Gun Scanning Electron Microscope (FESEM) with STEM + Energy Dispersive Spectrometer (EDS)
- Variable Pressure - Field Emission Gun Scanning Electron Microscope (VP-FESEM) + Energy Dispersive Spectrometer (EDS) + Wavelength Dispersive X-Ray Analysis (WDS) + Electron Backscatter Diffraction (EBSD) + Cathodoluminescence (CL)
- Dual Beam System with Scanning Transmission Electron Microscope (STEM) + Energy Dispersive Spectrometer (EDS)
- Plasma Dual Beam System + Energy Dispersive Spectrometer (EDS) + Electron Backscatter Diffraction (EBSD) + fibSIMS capabilities
- Transmission Electron Microscope (TEM) + Selected Area (electron) Diffraction (SAED) + Energy Dispersive Spectrometer (EDS) + Electron Energy Loss Spectroscopy (EELS)
- Nano-indenter and Micro-indenter with Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM)
- Atomic Force Microscopy (AFM)
- Time of Flight - Secondary Ion Mass Spectrometry (TOF-SIMS)
- Auger Electron Spectroscopy (AES)
- Multi-technique X-ray Photoelectron Spectroscopy (XPS) with Ultraviolet Photoelectron Spectroscopy (UPS), Ion Scattering Spectrometer (ISS) and Reflection Electron Energy Loss Spectroscopy (REELS) capabilities
- X-ray Photoelectron Spectroscopy (XPS) + Gas Cluster Ion Beam (GCIB)
- Raman Spectroscopy with 4 lasers (325nm(UV), 473(Blue), 532(Green), 785(NIR))
Our
Certification
Accreditation for failure analysis
accreditation for reliability lab
iso certication for reliability lab
